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j m lauenstein m c casey k a label single event process

single event latchup: Topics by WorldWideScience.org

Moran, A.; LaBel, K.; Gates, M.; Seidleck, C.; McGraw, R.; Casey, Megan C.; Pellish, Jonathan A.; Lauenstein, Jean-Marie; Wilcox

Single-Event Threats for Diodes - Its Not Just Schottky Diodes

Single-Event Threats for Diodes - It%27s Not Just Schottky DiodesCasey, Megan CLauenstein, JeanMarieWilcox, Edward PPhan, Anthony MLaBel, Kenneth A

2015 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE - PDF

[:30] Session C Single Event Effects: Devices C. Casey, E. P. Wilcox 2, J.-M. Lauenstein, A. D. Topper 2, K. A. LaBel

Failure Estimates for SiC Power MOSFETs in Space Electronics

(REDW) - Compendium of Current Single Event Effects Results from NASA Casey, Megan C.Lauenstein, Jean MarieWyrwas, Edward J.Guertin, Steven M

called single event: Topics by Science.gov

Single Event Upsets (SEU) on DRAMs and SRAMs, Label, Kenneth A.; Cooley, James A.; Stassi Casey, Megan C.; Lauenstein, Jean-Marie; Cam

Single-Event Threats for Diodes - It%27s Not Just Schottky

Single-Event Threats for Diodes - It%27s Not Just Schottky DiodesCasey, Megan CLauenstein, JeanMarieWilcox, Edward PPhan, Anthony MLaBel, Kenneth A

Megan C. Caseys research works

Megan C. Caseys 18 research works with 39 citations and 297 reads, including: NASA Goddard Space Flight Centers Compendium of Recent Total Ionizing

Compendium of Current Single Event Effects Results from NASA

Compendium of Current Single Event Effects Results Megan C. CaseyNASA/GSFC, Code 561.4, GreenJean Marie LauensteinNASA/GSFC, Code 561.4,

single event study: Topics by WorldWideScience.org

single event upset (SEU) of semiconductor devices the relative transverse momentum k t at the M.; Fulcher, J.R.; Hall, G.; Huhtinen,

Compendium of Single Event Effect Results from NASA Goddard

Compendium of Single Event Effect Results from NASA Goddard Space Flight Michael J. CampolaMegan C. CaseyJean-Marie LauensteinEdward P. Wilcox

Megan C. Caseys research works

Megan C. Caseys 18 research works with 39 citations and 297 reads, including: NASA Goddard Space Flight Centers Compendium of Recent Total Ionizing

casey m c 2013

doi:10.1109/REDW.2013.6658205Lauenstein, Jean-MarieTopper, Alyson D.Casey, Megan C.Wilcox, Edward P.Phan, Anthony M.Kim, Hak S.LaBel, Kenneth A

Megan C. Caseys research works

Megan C. Caseys 18 research works with 39 citations and 297 reads, including: NASA Goddard Space Flight Centers Compendium of Recent Total Ionizing

Session C - IEEE NSREC 2019

neutron-induced single-event effects should be lowered from 10 MeV to 1 J.-M. Lauenstein, M. C. Casey, R. L. Ladbury, K. A. LaBel, NASA

casey m c 2016

LaBel, Kenneth A.Szabo, Carl M.Chen, DakaiCampola, Michael J.Casey, Megan C.Lauenstein, Jean-MarieWilcox, Edward P.Ladbury, Raymond L

Destructive Single-Event Effects in Diodes

Destructive Single-Event Effects in DiodesCampola, Michael JPhan, Anthony MLabel, Kenneth ACasey, Megan CLauenstein, JeanMarie

Lessons Learned and Guideline Documents

2016223-Power Devices by Jean-Marie Lauenstein, Megan C.Casey, Alyson J. Topper, Edward T. Wilcox, LaBelSingle-Event Effects Induced by Pulsed

A First Look at 22 nm FDSOI SRAM Single-Event Test Results [

A First Look at 22 nm FDSOI SRAM Single-Event Test Results [STUB]Casey, Megan CStansberry, ScottSeidleck, Christina MMaharrey, Jeffrey A

Single-Event Effect Testing of the Cree C4D40120D Commercial

Single-Event Effect Testing of the Cree C4D40120D Commercial 1200V Silicon Carbide Schottky DiodeLauenstein, J.MCasey, M. C

Single-Event Effects in Silicon Carbide Power

J.-M. Lauenstein, M. C. Casey, K. A. LaBel, S. Ikpe, A. D. Topper, E. P. Wilcox, H. Kim and A. M. Phan, Single-Event Effects in

Boutte, Alvin Joseph | Goddard Library Repository

Campola M, Cochran D, Alt S, Boutte A, Chen D, Gigliuto R, Label K, Pellish J, Ladbury R, Casey M, Wilcox E, OBryan M, Lauenstein J,

Megan C. Caseys research works

Megan C. Caseys 18 research works with 39 citations and 297 reads, including: NASA Goddard Space Flight Centers Compendium of Recent Total Ionizing

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